SPC systems and stations

SPC software is used to ensure statistical regulation of the production process and monitoring of product quality parameters. Data input can be performed via the keyboard, by direct reading of data from gauges connected to the SPC station or by automatic data collection via measuring devices and sensors.

The SPC module for measurable parameters supports multiple types of distributions Normal, Weibull, Rayleigh, Beta, Exponential, Fisher-F, Gamma, Chi-squared, LogNormal and Student-T. The Box-Cox transform is also available.

There are control cards X − Rs (individual value card), X − Rst (individual value card - target), X − R, X − s, Me − R (median card) available. For attribute features are available cards c, u, p, np. When performing its own measurement, the program ensures immediate drawing of the monitored characteristics into the control card, recalculation of control limits and indicators Cp, Cpk, Pp, Ppk, including confidence intervals.

For a more detailed analysis of monitored processes, there is a table of important process indicators, table of measured values, QQ Plot, histogram including plotting of probability density curve (Gaussian curves, ...), tests of conformity with specified type of distribution, test of distance of measured values, graphical evaluation of trend process and other tools to select the required data set for analysis.

Tools for collecting and evaluating attributive parameters (defect cards) are available for monitoring attributive features or scrapping process. You can find more details in the module Scrap reporting - Defect cards.

Summary of the main elements of the SPC module:

• simple and fast definition of the control card plan
• tools for calculating fixed control limits based on customer requirements or knowledge of process variability
• setting the measurement order by sample or by parameters
• possibility to insert a photo to the measured parameters (visualization of how to perform measurements)
• possibility of direct connection with gauges and measuring devices for automatic monitoring of product quality parameters
• functions for constructing a Q-Q Plot and a Histogram, including plotting a probability density curve of a given type of distribution
• normality tests, tests of agreement with abnormal types of distributions <-li>
• test of remoteness of measured values
• display of the table of measured values ​​including the name of the operator
• calculation of important statistical indicators of the process, including natural regulatory limits
• graphical representation of the process trend using the course of indicators Pp, Ppk
• the possibility of indicating surveys that are not to be included in the calculation of indicators
• the possibility of recording immediate measures, detected defects and possibility to attach photo of defects directly into the control card for the given plan
• function for automatic detection of suspicious products based on measured values
• support for visualization of the measured product status using the ANDON system